Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
نویسندگان
چکیده
منابع مشابه
Optimal step-stress accelerated degradation test plan for Gamma process
Step-stress accelerated degradation test (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a normal-use condition) when the available test items are very few. Recently, an optimal SSADT plan has been proposed in the literature which is based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation...
متن کاملAccelerated Destructive Degradation Test Planning
Accelerated Destructive Degradation Tests (ADDTs) provide reliability information quickly. An ADDT plan specifies factor level combinations of an accelerating variable (e.g., temperature) and evaluation time and the allocations of test units to these combinations. This paper describes methods to find good ADDT plans for an important class of destructive degradation models. First, a collection o...
متن کاملOptimal Design for Step-Stress Accelerated Test with Random Discrete Stress Elevating Times Based on Gamma Degradation Process
Recently, a step-stress accelerated degradation test (SSADT) plan, in which the stress level is elevated when the degradation value of a product crosses a pre-specified value, was proposed. The times of stress level elevating are random and vary from product to product. In this paper we extend this model to a more economic plan. The proposed extended model has two economical advantages compared...
متن کاملAccelerated Degradation Tests: Modeling and Analysis
High reliability systems generally require individual system components having extremely high reliability over long periods of time. Short product development times require reliability tests to be conducted with severe time constraints. Frequently few or no failures occur during such tests, even with acceleration. Thus, it is difficult to assess reliability with traditional life tests that reco...
متن کاملPhotometric and Colorimetric Assessment of LED Chip Scale Packages by Using a Step-Stress Accelerated Degradation Test (SSADT) Method
By solving the problem of very long test time on reliability qualification for Light-emitting Diode (LED) products, the accelerated degradation test with a thermal overstress at a proper range is regarded as a promising and effective approach. For a comprehensive survey of the application of step-stress accelerated degradation test (SSADT) in LEDs, the thermal, photometric, and colorimetric pro...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Reliability Engineering & System Safety
سال: 2016
ISSN: 0951-8320
DOI: 10.1016/j.ress.2016.06.002